Massively extended Modular Monitoring for Upper Stages

Resultado final

Report on Preliminary System Architecture

Description of first version of the system architecture

Report on fault injection and self-testing on a selected case study (draft)
Benchmarking report for advanced dependability techniques
Report on proposed dependability evaluation techniques
Report on proposed dependability enhancement techniques (final with results)

Report on aproposed dependability enhancement techniques (final with results)

Report on proposed dependability enhancement techniques (draft)

Publicaciones

About On-line Functionally Untestable Fault Identification in Microprocessor Cores for Safety-Critical Applications

Autores: R. Cantoro, A. Firrincieli, D. Piumatti, M. Restifo, E. Sanchez, M. Sonza Reorda
Publicado en: IEEE Latin American Test Symposium (LATS), 2018
Editor: IEEE

On the Optimization of SBST Test Program Compaction

Autores: Riccardo Cantoro, Ernesto Sanchez, Matteo Sonza Reorda, Giovanni Squillero and Emanuele Valea
Publicado en: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2017
Editor: IEEE

Automated test program reordering for efficient SBST

Autores: R. Cantoro, E. Cetrulo, E. Sanchez, M. Sonza Reorda, A. Voza
Publicado en: 2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS), 2017, Página(s) 1-6, ISBN 978-1-5386-5108-7
Editor: IEEE
DOI: 10.1109/DCIS.2017.8311634

On the Compression of Spacecraft Housekeeping Data using Discrete Cosine Transforms

Autores: Meß, J.-G. and Schmidt, R. and Fey, G., Dannemann, F.
Publicado en: ESA International Workshop on Tracking, Telemetry and Command Systems for Space Applications, 2016
Editor: IEEE

Towards Making Fault Injection on Abstract Models a More Accurate Tool for Predicting RT-Level Effects

Autores: Tino Flenker, Jan Malburg, Görschwin Fey, Serhiy Avramenko
Publicado en: IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2017
Editor: IEEE

On the test of a COTS-based system for space applications

Autores: S. Carbonara, A. Firrincieli, M.Sonza Reorda, J.-G.Mess
Publicado en: IEEE International On-Line Testing Symposium (IOLTS), 2018
Editor: IEEE

An analysis of test solutions for COTS-based systems in space applications

Autores: R. Cantoro, S. Carbonara, A. Floridia, E. Sanchez, M. Sonza Reorda, J.-G. Mess
Publicado en: IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SOC), 2018
Editor: IEEE

Massively Extended Modular Monitoring and a Second Life for Upper Stages

Autores: J.-G. Mess, M. Sonza Reorda, M. Violante, F. Dannemann, B. Hanson, N. Karlsson, T. Kuremyr, S. Söderholm, Y. Albert, J. Spiecker
Publicado en: Proceedings of the International Astronautical Congress (IAC) 2018, 2018
Editor: International Astronautical Confederation

On the robustness of compression algorithms for space applications

Autores: Avramenko, S. and Sonza Reorda, M. and Violante, M. and Fey, G. and Meß, J.-G. and Schmidt, R.
Publicado en: IEEE International On-Line Testing Symposium (IOLTS), 2016
Editor: IEEE

Adaptive compression schemes for housekeeping data

Autores: Jan-Gerd Mes, Robert Schmidt, Gorschwin Fey
Publicado en: 2017 IEEE Aerospace Conference, 2017, Página(s) 1-12, ISBN 978-1-5090-1613-6
Editor: IEEE
DOI: 10.1109/AERO.2017.7943580

Exploiting Error Detection Latency for Parity-based Soft Error Detection

Autores: Aydos, Gökçe and Fey, Görschwin
Publicado en: IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2016
Editor: IEEE

On the analysis of the effects of soft errors on compression algorithms

Autores: Avramenko, S. and Sonza Reorda, M. and Violante, M. and Fey, G
Publicado en: IEEE Latin American Test Symposium (LATS), 2016
Editor: IEEE

A High-Level Approach to Analyze the Effects of Soft Errors on Lossless Compression Algorithms

Autores: Serhiy Avramenko, Matteo Sonza Reorda, Massimo Violante, Görschwin Fey
Publicado en: Journal of Electronic Testing: Theory and Applications (JETTA), 2017, ISSN 0923-8174
Editor: Kluwer Academic Publishers

Empirical results on parity-based soft error detection with software-based retry

Autores: Gökçe Aydos, Goerschwin Fey
Publicado en: Microprocessors and Microsystems, Edición 48, 2017, Página(s) 62-68, ISSN 0141-9331
Editor: Elsevier BV
DOI: 10.1016/j.micpro.2016.09.009

Resultado final

Publicaciones

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