Deliverables
Description of first version of the system architecture
Report on fault injection and self-testing on a selected case study (draft)Benchmarking report for advanced dependability techniques
Report on proposed dependability evaluation techniques
Report on proposed dependability enhancement techniques (final with results)
Report on aproposed dependability enhancement techniques (final with results)
Report on proposed dependability enhancement techniques (draft)Publications
Author(s):
R. Cantoro, A. Firrincieli, D. Piumatti, M. Restifo, E. Sanchez, M. Sonza Reorda
Published in:
IEEE Latin American Test Symposium (LATS), 2018
Publisher:
IEEE
Author(s):
Riccardo Cantoro, Ernesto Sanchez, Matteo Sonza Reorda, Giovanni Squillero and Emanuele Valea
Published in:
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2017
Publisher:
IEEE
Author(s):
R. Cantoro, E. Cetrulo, E. Sanchez, M. Sonza Reorda, A. Voza
Published in:
2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS), 2017, Page(s) 1-6, ISBN 978-1-5386-5108-7
Publisher:
IEEE
DOI:
10.1109/DCIS.2017.8311634
Author(s):
Meß, J.-G. and Schmidt, R. and Fey, G., Dannemann, F.
Published in:
ESA International Workshop on Tracking, Telemetry and Command Systems for Space Applications, 2016
Publisher:
IEEE
Author(s):
Tino Flenker, Jan Malburg, Görschwin Fey, Serhiy Avramenko
Published in:
IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2017
Publisher:
IEEE
Author(s):
S. Carbonara, A. Firrincieli, M.Sonza Reorda, J.-G.Mess
Published in:
IEEE International On-Line Testing Symposium (IOLTS), 2018
Publisher:
IEEE
Author(s):
R. Cantoro, S. Carbonara, A. Floridia, E. Sanchez, M. Sonza Reorda, J.-G. Mess
Published in:
IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SOC), 2018
Publisher:
IEEE
Author(s):
J.-G. Mess, M. Sonza Reorda, M. Violante, F. Dannemann, B. Hanson, N. Karlsson, T. Kuremyr, S. Söderholm, Y. Albert, J. Spiecker
Published in:
Proceedings of the International Astronautical Congress (IAC) 2018, 2018
Publisher:
International Astronautical Confederation
Author(s):
Avramenko, S. and Sonza Reorda, M. and Violante, M. and Fey, G. and Meß, J.-G. and Schmidt, R.
Published in:
IEEE International On-Line Testing Symposium (IOLTS), 2016
Publisher:
IEEE
Author(s):
Jan-Gerd Mes, Robert Schmidt, Gorschwin Fey
Published in:
2017 IEEE Aerospace Conference, 2017, Page(s) 1-12, ISBN 978-1-5090-1613-6
Publisher:
IEEE
DOI:
10.1109/AERO.2017.7943580
Author(s):
Aydos, Gökçe and Fey, Görschwin
Published in:
IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2016
Publisher:
IEEE
Author(s):
Avramenko, S. and Sonza Reorda, M. and Violante, M. and Fey, G
Published in:
IEEE Latin American Test Symposium (LATS), 2016
Publisher:
IEEE
Author(s):
Serhiy Avramenko, Matteo Sonza Reorda, Massimo Violante, Görschwin Fey
Published in:
Journal of Electronic Testing: Theory and Applications (JETTA), 2017, ISSN 0923-8174
Publisher:
Kluwer Academic Publishers
Author(s):
Gökçe Aydos, Goerschwin Fey
Published in:
Microprocessors and Microsystems, Issue 48, 2017, Page(s) 62-68, ISSN 0141-9331
Publisher:
Elsevier BV
DOI:
10.1016/j.micpro.2016.09.009
Searching for OpenAIRE data...
There was an error trying to search data from OpenAIRE
No results available