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NANOmaterials: STRategies for Safety Assessments in advanced Integrated Circuits Manufacturing

Risultati finali

Health monitoring guideline
List of air sampling equipments & List of environmental and individual monitoring devices

. List of air sampling equipments . List of environmental and individual monitoring devices

Identification of the most appropriate risk assessment methodologies (including gap analysis) for use in the semiconductor industry. Guidance on the use of risk assessment methodology for semiconductor industry (Combined deliverable T3.1 and T3.2).
Assessment report: gaps identified about water and wastewater characterization
A list of nanomaterials currently used in the semiconductor sector to be considered within NANOSTREEM
Comparison of occupational exposure values
Recommendations for use of emission monitoring as a complement to risk banding
Report on establishment NanoStreeM Safety Community
Public Project factsheet
List of standards for air sampling, as applicable in semiconductor activity ; Gaps identified

. List of standards for air sampling, as applicable in semiconductor activity . Gaps identified

Gap analysis on information and data for NP exposure scenarios in semiconductor industryGap analysis on information and data for NP exposure scenarios in semiconductor industry

Gap analysis on information and data for NP exposure scenarios in semiconductor industry

A set of typical relevant exposure scenarios for NP’s in semiconductor industry
For nanomaterials listed in D1.1, a list of associated tasks, activities and operations where exposure might occur.
Public final project report
A list of nanomaterials that are of strategic importance for the semiconductor sector in the future

Pubblicazioni

A list of nanomaterials that are of strategic importance for the semiconductor sector in the future

Autori: Jank, Michael; Heyns, Marc; Prodanov Dimiter,
Pubblicato in: Numero 1, 2019
Editore: -
DOI: 10.5281/zenodo.2538649

Identification of the most appropriate risk assessment methodologies for use in the semiconductor industry

Autori: Le Feber, Maaike; Prodanov, Dimiter; Zimmermann, Eric
Pubblicato in: Numero 2, 2017
Editore: -
DOI: 10.5281/zenodo.1188143

A set of typical relevant exposure scenarios for nanoparticles in semiconductor industry

Autori: Prodanov, Dimiter; Belde, Peter; Moclair, Fiona
Pubblicato in: Numero 3, 2018
Editore: -
DOI: 10.5281/zenodo.2538388

A list of associated tasks, activities and operations where exposure might occur

Autori: Belde, Peter; Maillet, Jean-Christophe; Moclair, Fiona; Morelli, Atillio; Prodanov, Dimiter; Roquet, Pascal
Pubblicato in: Numero 3, 2017
Editore: -
DOI: 10.5281/zenodo.804441

A list of nanomaterials currently used in the semiconductor sector to be considered within NanoStreeM

Autori: Belde, Peter; Durand, Catherine; Jank, Michael; Maillet, Jean-Christophe; Moclair, Fiona; Morelli, Atillio; Pook, Beatrix; Prodanov, Dimiter; Roquet, Pascal
Pubblicato in: Numero 1, 2016
Editore: -
DOI: 10.5281/zenodo.804436

A list of nanomaterials that are of strategic importance for the semiconductor sector in the future

Autori: Michael Jank; Marc Heyns
Pubblicato in: Numero 2, 2017
Editore: -
DOI: 10.5281/zenodo.557082

Analytical and Numerical Treatments of Conservative Diffusions and the Burgers Equation

Autori: Dimiter Prodanov
Pubblicato in: Entropy, Numero 20/7, 2018, Pagina/e 492, ISSN 1099-4300
Editore: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/e20070492

Management of health risk related to use of engineered nanomaterials. An analogy with biosafety

Autori: Dimiter Prodanov
Pubblicato in: Biomedical Reviews, Numero 28/0, 2018, Pagina/e 100, ISSN 1310-392X
Editore: Bulgarian-American Center
DOI: 10.14748/bmr.v28.4455

Banding approach for engineered nanomaterial risk assessment and control

Autori: Nausikaä Van Hoornick, Dimiter Prodanov, Alain Pardon
Pubblicato in: Journal of Physics: Conference Series, Numero 838, 2017, Pagina/e 012017, ISSN 1742-6588
Editore: Institute of Physics
DOI: 10.1088/1742-6596/838/1/012017

Prospects and issues of nanomaterials use in microelectronics: Poster presented at Materials Research Society Spring Meeting 2016, Phoenix, Arizona, USA

Autori: Jank, Michael; Bauer, Anton; Frey, Lothar
Pubblicato in: Fraunhofer IISB, Numero 3, 2016
Editore: -

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