Skip to main content
European Commission logo
polski polski
CORDIS - Wyniki badań wspieranych przez UE
CORDIS
CORDIS Web 30th anniversary CORDIS Web 30th anniversary

NANOmaterials: STRategies for Safety Assessments in advanced Integrated Circuits Manufacturing

Rezultaty

Health monitoring guideline
List of air sampling equipments & List of environmental and individual monitoring devices

. List of air sampling equipments . List of environmental and individual monitoring devices

Identification of the most appropriate risk assessment methodologies (including gap analysis) for use in the semiconductor industry. Guidance on the use of risk assessment methodology for semiconductor industry (Combined deliverable T3.1 and T3.2).
Assessment report: gaps identified about water and wastewater characterization
A list of nanomaterials currently used in the semiconductor sector to be considered within NANOSTREEM
Comparison of occupational exposure values
Recommendations for use of emission monitoring as a complement to risk banding
Report on establishment NanoStreeM Safety Community
Public Project factsheet
List of standards for air sampling, as applicable in semiconductor activity ; Gaps identified

. List of standards for air sampling, as applicable in semiconductor activity . Gaps identified

Gap analysis on information and data for NP exposure scenarios in semiconductor industryGap analysis on information and data for NP exposure scenarios in semiconductor industry

Gap analysis on information and data for NP exposure scenarios in semiconductor industry

A set of typical relevant exposure scenarios for NP’s in semiconductor industry
For nanomaterials listed in D1.1, a list of associated tasks, activities and operations where exposure might occur.
Public final project report
A list of nanomaterials that are of strategic importance for the semiconductor sector in the future

Publikacje

A list of nanomaterials that are of strategic importance for the semiconductor sector in the future

Autorzy: Jank, Michael; Heyns, Marc; Prodanov Dimiter,
Opublikowane w: Numer 1, 2019
Wydawca: -
DOI: 10.5281/zenodo.2538649

Identification of the most appropriate risk assessment methodologies for use in the semiconductor industry

Autorzy: Le Feber, Maaike; Prodanov, Dimiter; Zimmermann, Eric
Opublikowane w: Numer 2, 2017
Wydawca: -
DOI: 10.5281/zenodo.1188143

A set of typical relevant exposure scenarios for nanoparticles in semiconductor industry

Autorzy: Prodanov, Dimiter; Belde, Peter; Moclair, Fiona
Opublikowane w: Numer 3, 2018
Wydawca: -
DOI: 10.5281/zenodo.2538388

A list of associated tasks, activities and operations where exposure might occur

Autorzy: Belde, Peter; Maillet, Jean-Christophe; Moclair, Fiona; Morelli, Atillio; Prodanov, Dimiter; Roquet, Pascal
Opublikowane w: Numer 3, 2017
Wydawca: -
DOI: 10.5281/zenodo.804441

A list of nanomaterials currently used in the semiconductor sector to be considered within NanoStreeM

Autorzy: Belde, Peter; Durand, Catherine; Jank, Michael; Maillet, Jean-Christophe; Moclair, Fiona; Morelli, Atillio; Pook, Beatrix; Prodanov, Dimiter; Roquet, Pascal
Opublikowane w: Numer 1, 2016
Wydawca: -
DOI: 10.5281/zenodo.804436

A list of nanomaterials that are of strategic importance for the semiconductor sector in the future

Autorzy: Michael Jank; Marc Heyns
Opublikowane w: Numer 2, 2017
Wydawca: -
DOI: 10.5281/zenodo.557082

Analytical and Numerical Treatments of Conservative Diffusions and the Burgers Equation

Autorzy: Dimiter Prodanov
Opublikowane w: Entropy, Numer 20/7, 2018, Strona(/y) 492, ISSN 1099-4300
Wydawca: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/e20070492

Management of health risk related to use of engineered nanomaterials. An analogy with biosafety

Autorzy: Dimiter Prodanov
Opublikowane w: Biomedical Reviews, Numer 28/0, 2018, Strona(/y) 100, ISSN 1310-392X
Wydawca: Bulgarian-American Center
DOI: 10.14748/bmr.v28.4455

Banding approach for engineered nanomaterial risk assessment and control

Autorzy: Nausikaä Van Hoornick, Dimiter Prodanov, Alain Pardon
Opublikowane w: Journal of Physics: Conference Series, Numer 838, 2017, Strona(/y) 012017, ISSN 1742-6588
Wydawca: Institute of Physics
DOI: 10.1088/1742-6596/838/1/012017

Prospects and issues of nanomaterials use in microelectronics: Poster presented at Materials Research Society Spring Meeting 2016, Phoenix, Arizona, USA

Autorzy: Jank, Michael; Bauer, Anton; Frey, Lothar
Opublikowane w: Fraunhofer IISB, Numer 3, 2016
Wydawca: -

Wyszukiwanie danych OpenAIRE...

Podczas wyszukiwania danych OpenAIRE wystąpił błąd

Brak wyników