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NANOmaterials: STRategies for Safety Assessments in advanced Integrated Circuits Manufacturing

Deliverables

Health monitoring guideline
List of air sampling equipments & List of environmental and individual monitoring devices

. List of air sampling equipments . List of environmental and individual monitoring devices

Identification of the most appropriate risk assessment methodologies (including gap analysis) for use in the semiconductor industry. Guidance on the use of risk assessment methodology for semiconductor industry (Combined deliverable T3.1 and T3.2).
Assessment report: gaps identified about water and wastewater characterization
A list of nanomaterials currently used in the semiconductor sector to be considered within NANOSTREEM
Comparison of occupational exposure values
Recommendations for use of emission monitoring as a complement to risk banding
Report on establishment NanoStreeM Safety Community
Public Project factsheet
List of standards for air sampling, as applicable in semiconductor activity ; Gaps identified

. List of standards for air sampling, as applicable in semiconductor activity . Gaps identified

Gap analysis on information and data for NP exposure scenarios in semiconductor industryGap analysis on information and data for NP exposure scenarios in semiconductor industry

Gap analysis on information and data for NP exposure scenarios in semiconductor industry

A set of typical relevant exposure scenarios for NP’s in semiconductor industry
For nanomaterials listed in D1.1, a list of associated tasks, activities and operations where exposure might occur.
Public final project report
A list of nanomaterials that are of strategic importance for the semiconductor sector in the future

Publications

A list of nanomaterials that are of strategic importance for the semiconductor sector in the future

Author(s): Jank, Michael; Heyns, Marc; Prodanov Dimiter,
Published in: Issue 1, 2019
Publisher: -
DOI: 10.5281/zenodo.2538649

Identification of the most appropriate risk assessment methodologies for use in the semiconductor industry

Author(s): Le Feber, Maaike; Prodanov, Dimiter; Zimmermann, Eric
Published in: Issue 2, 2017
Publisher: -
DOI: 10.5281/zenodo.1188143

A set of typical relevant exposure scenarios for nanoparticles in semiconductor industry

Author(s): Prodanov, Dimiter; Belde, Peter; Moclair, Fiona
Published in: Issue 3, 2018
Publisher: -
DOI: 10.5281/zenodo.2538388

A list of associated tasks, activities and operations where exposure might occur

Author(s): Belde, Peter; Maillet, Jean-Christophe; Moclair, Fiona; Morelli, Atillio; Prodanov, Dimiter; Roquet, Pascal
Published in: Issue 3, 2017
Publisher: -
DOI: 10.5281/zenodo.804441

A list of nanomaterials currently used in the semiconductor sector to be considered within NanoStreeM

Author(s): Belde, Peter; Durand, Catherine; Jank, Michael; Maillet, Jean-Christophe; Moclair, Fiona; Morelli, Atillio; Pook, Beatrix; Prodanov, Dimiter; Roquet, Pascal
Published in: Issue 1, 2016
Publisher: -
DOI: 10.5281/zenodo.804436

A list of nanomaterials that are of strategic importance for the semiconductor sector in the future

Author(s): Michael Jank; Marc Heyns
Published in: Issue 2, 2017
Publisher: -
DOI: 10.5281/zenodo.557082

Analytical and Numerical Treatments of Conservative Diffusions and the Burgers Equation

Author(s): Dimiter Prodanov
Published in: Entropy, Issue 20/7, 2018, Page(s) 492, ISSN 1099-4300
Publisher: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/e20070492

Management of health risk related to use of engineered nanomaterials. An analogy with biosafety

Author(s): Dimiter Prodanov
Published in: Biomedical Reviews, Issue 28/0, 2018, Page(s) 100, ISSN 1310-392X
Publisher: Bulgarian-American Center
DOI: 10.14748/bmr.v28.4455

Banding approach for engineered nanomaterial risk assessment and control

Author(s): Nausikaä Van Hoornick, Dimiter Prodanov, Alain Pardon
Published in: Journal of Physics: Conference Series, Issue 838, 2017, Page(s) 012017, ISSN 1742-6588
Publisher: Institute of Physics
DOI: 10.1088/1742-6596/838/1/012017

Prospects and issues of nanomaterials use in microelectronics: Poster presented at Materials Research Society Spring Meeting 2016, Phoenix, Arizona, USA

Author(s): Jank, Michael; Bauer, Anton; Frey, Lothar
Published in: Fraunhofer IISB, Issue 3, 2016
Publisher: -

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