Livrables
List of air sampling equipments & List of environmental and individual monitoring devices
. List of air sampling equipments . List of environmental and individual monitoring devices
Identification of the most appropriate risk assessment methodologies (including gap analysis) for use in the semiconductor industry. Guidance on the use of risk assessment methodology for semiconductor industry (Combined deliverable T3.1 and T3.2).Assessment report: gaps identified about water and wastewater characterization
A list of nanomaterials currently used in the semiconductor sector to be considered within NANOSTREEM
Comparison of occupational exposure values
Recommendations for use of emission monitoring as a complement to risk banding
Report on establishment NanoStreeM Safety Community
Public Project factsheet
List of standards for air sampling, as applicable in semiconductor activity ; Gaps identified
. List of standards for air sampling, as applicable in semiconductor activity . Gaps identified
Gap analysis on information and data for NP exposure scenarios in semiconductor industryGap analysis on information and data for NP exposure scenarios in semiconductor industryGap analysis on information and data for NP exposure scenarios in semiconductor industry
A set of typical relevant exposure scenarios for NP’s in semiconductor industryFor nanomaterials listed in D1.1, a list of associated tasks, activities and operations where exposure might occur.
Public final project report
A list of nanomaterials that are of strategic importance for the semiconductor sector in the future
Workshop report
Publications
Auteurs:
Jank, Michael; Heyns, Marc; Prodanov Dimiter,
Publié dans:
Numéro 1, 2019
Éditeur:
-
DOI:
10.5281/zenodo.2538649
Auteurs:
Le Feber, Maaike; Prodanov, Dimiter; Zimmermann, Eric
Publié dans:
Numéro 2, 2017
Éditeur:
-
DOI:
10.5281/zenodo.1188143
Auteurs:
Prodanov, Dimiter; Belde, Peter; Moclair, Fiona
Publié dans:
Numéro 3, 2018
Éditeur:
-
DOI:
10.5281/zenodo.2538388
Auteurs:
Belde, Peter; Maillet, Jean-Christophe; Moclair, Fiona; Morelli, Atillio; Prodanov, Dimiter; Roquet, Pascal
Publié dans:
Numéro 3, 2017
Éditeur:
-
DOI:
10.5281/zenodo.804441
Auteurs:
Belde, Peter; Durand, Catherine; Jank, Michael; Maillet, Jean-Christophe; Moclair, Fiona; Morelli, Atillio; Pook, Beatrix; Prodanov, Dimiter; Roquet, Pascal
Publié dans:
Numéro 1, 2016
Éditeur:
-
DOI:
10.5281/zenodo.804436
Auteurs:
Michael Jank; Marc Heyns
Publié dans:
Numéro 2, 2017
Éditeur:
-
DOI:
10.5281/zenodo.557082
Auteurs:
Dimiter Prodanov
Publié dans:
Entropy, Numéro 20/7, 2018, Page(s) 492, ISSN 1099-4300
Éditeur:
Multidisciplinary Digital Publishing Institute (MDPI)
DOI:
10.3390/e20070492
Auteurs:
Dimiter Prodanov
Publié dans:
Biomedical Reviews, Numéro 28/0, 2018, Page(s) 100, ISSN 1310-392X
Éditeur:
Bulgarian-American Center
DOI:
10.14748/bmr.v28.4455
Auteurs:
Nausikaä Van Hoornick, Dimiter Prodanov, Alain Pardon
Publié dans:
Journal of Physics: Conference Series, Numéro 838, 2017, Page(s) 012017, ISSN 1742-6588
Éditeur:
Institute of Physics
DOI:
10.1088/1742-6596/838/1/012017
Auteurs:
Jank, Michael; Bauer, Anton; Frey, Lothar
Publié dans:
Fraunhofer IISB, Numéro 3, 2016
Éditeur:
-
Recherche de données OpenAIRE...
Une erreur s’est produite lors de la recherche de données OpenAIRE
Aucun résultat disponible