Descripción del proyecto
Liberar el poder del diseño preciso de productos
El desarrollo de productos basados en intrincados sistemas materiales y estructuras a nanoescala, como las células solares de tercera generación, siempre ha sido un reto. Las propiedades electrónicas de los semiconductores masivos, fundamentales para estos productos, a menudo quedan eclipsadas o distorsionadas por las complejas propiedades de la interfaz del material, lo que complica el proceso de diseño. En este contexto, el equipo del proyecto MMAMA, financiado con fondos europeos, pretende transformar la industria manufacturera europea. Aprovechando la potencia de los microscopios de microondas de barrido, los resonadores dieléctricos y las simulaciones avanzadas, se busca medir y comprender las propiedades de los materiales y las interfaces de sistemas materiales complejos y nanoestructuras. Esta técnica aportará conocimientos cruciales que conducirán a procesos de diseño rentables. Además, el entorno de innovación abierta del proyecto facilitará su adopción por la industria europea.
Objetivo
Products which require complicated material systems and nanoscale structural organization, e.g. third-generation solar cells, are often difficult to develop. This is because electronic properties of bulk semiconductors are often masked or at least strongly superimposed by material interface properties. Additionally these interface properties are also complex and thus make product design difficult.
This project aims at solving this problem by offering a nanoscale characterization platform for the European manufacturers of coatings, photovoltaic cells, and semi-conductor circuits. It is proposed to use a combination of scanning microwave microscopes, dielectric resonators, and simulation to measure the material and interface properties of complicated material systems and nano-structures. A metrological system of cross-checks between different instruments, models and simulations with associated error bars is indispensable for obtaining trustworthy results.
Scanning microwave measurements will be directly used for three-dimensional characterization of electrical properties of nanostructured semiconductors used in organic and hybrid photovoltaic cells. The objective is to accelerate the development of high efficiency cells and to have measures to predict performances in early stages of prototype production. Where process monitoring of materials with nanostructures is necessary, a dielectric resonator is used to translate insights from scanning microwave microscope measurements to fabrication environments. Such dielectric resonators could be directly integrated in production lines for monitoring thin film deposition processes.
An open innovation environment will make the uptake of the results easier for European industry. A database containing exemplary measurement datasets of scanning microwave microscopes will be available in calibrated and raw versions. Simulation results of tip-semiconductor interactions will be made available on the EMMC Modeling Market Place.
Ámbito científico
Not validated
Not validated
- natural scienceschemical sciencesorganic chemistry
- engineering and technologymaterials engineeringcomposites
- natural sciencesphysical sciencesopticsmicroscopy
- engineering and technologymaterials engineeringcoating and films
- natural sciencesphysical scienceselectromagnetism and electronicssemiconductivity
Programa(s)
Tema(s)
Convocatoria de propuestas
Consulte otros proyectos de esta convocatoriaConvocatoria de subcontratación
H2020-NMBP-2017-two-stage
Régimen de financiación
RIA - Research and Innovation actionCoordinador
59000 Lille
Francia