Risultati finali
Video describing the different application of XSpectra inspection systems tested to use for dissemination and commercial exploitation
XSpectra Sales Training KitDelivery of XSpectra Sales Training Kit
Delivery of N5 XSpectra Reference Champions
Test report with statistical analysis of False Positive Alarms for different type of foods and Foreign bodies
XSpectra Operating manualsDelivery of a set of documents will be issued to support operators for the installation and maintenance of the Detection System
Delivery of N3 XSpectra Demo Centers installed
Pubblicazioni
Autori:
Manuele Bettelli, Nicola Sarzi Amadè, Davide Calestani, Bruno Garavelli, Pietro Pozzi, Daniele Macera, Luca Zanotti, Carlo Andrea Gonano, Matthew C. Veale, Andrea Zappettini
Pubblicato in:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Numero 960, 2020, Pagina/e 163663, ISSN 0168-9002
Editore:
Elsevier BV
DOI:
10.1016/j.nima.2020.163663
Autori:
Authors: B. Garavelli, P. Pozzi, D. Macera, L. Zanotti, A. Mencarelli, G. Bubba, P. Bertoni, M. Sammartini, M. Bettelli, G. Bertuccio, G. Ghiringhelli, A. Zappettini
Pubblicato in:
International Symposium on Room Temperature Semiconductor Detectors 2019, Numero Not available, 2019, Pagina/e Not available
Editore:
Conference organized by IEEE
Autori:
M. Sammartini, M. Gandola, F. Mele, B. Garavelli, D. Macera, P. Pozzi, G. Bertuccio
Pubblicato in:
International Symposium on Room Temperature Semiconductor Detectors 2019, Numero Not available, 2019, Pagina/e Not available
Editore:
Conference organized by IEEE
Autori:
N. Sarzi Amadè, M. Bettelli, B. Garavelli, P. Pozzi, D. Macera, L. Zanotti, C. A. Gonano, A. Zappettini
Title of the Journal/Proceedings/Books series/Book (for book chapters):
Number, date or frequency of the Journal/Proceedings/Book: Not available
Relevant pages: Not available
ISBN: Not available
Publisher: Conference organized by IEEE
Place of publication: Conference in Manchester, UK
Year of
Pubblicato in:
International Symposium on Room Temperature Semiconductor Detectors 2019, Numero Not available, 2019, Pagina/e Not available
Editore:
Conference organized by IEEE
Autori:
M. Bettelli, N. Sarzi Amadè, B. Garavelli, P. Pozzi, D. Macera, L. Zanotti, C. A. Gonano, A. Zappettini
Pubblicato in:
International Symposium on Room Temperature Semiconductor Detectors 2019, Numero Not available, 2019, Pagina/e Not available
Editore:
Conference organized by IEEE
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